Por favor, use este identificador para citar o enlazar este ítem: https://repositorio.cetys.mx/handle/60000/1109
Registro completo de metadatos
Campo DC Valor Lengua/Idioma
dc.contributor.advisorLicea Verduzco, Dania-
dc.contributor.authorMarcelo Sy, Enrico-
dc.date.accessioned2021-08-03T22:50:33Z-
dc.date.available2021-08-03T22:50:33Z-
dc.date.issued2018-06-15-
dc.identifier.citationSKYWORKSes_ES
dc.identifier.urihttps://repositorio.cetys.mx/handle/60000/1109-
dc.descriptionT2-2018es_ES
dc.description.abstractRF final test measurements include the DC to RF performance of components and are therefore included on the system offsets measurements to compensate for the deviations. The equivalent RF circuit of a test fixture involves parasitics and is complex; it can be lumped as a series or parallel circuit model, which represents the real and imaginary resistive and reactive parts of total equivalent circuit impedance. These parasitic components that greatly affect RF performance are significantly influenced by an uncontrolled variable such as the environmental factor. An environmental factor affects the behavior of the Radio Frequencies and microwave signals and impacts the parametric measured values. These measured value inconsistencies can result in incorrectly passing or failing products during the final test, such as when performing design validation, characterization and qualification before transitioning to final test production process. During test production set-up, often times a fixture-tester mismatch is encountered as an effect on measurement error as an added parasitic catalyst when humidity is introduced. This proposed project goal is to eliminate tester mismatch problem that are encountered on the test floor. This project is also completed in fulfillment for the requirement in Master’s Degree program in Engineering and Innovation. To achieve this, a new process method is proposed to provide solution to the existing problem that the current method does not consider. This proposed method is based on the experiment that was done thru simulations and circuit modeling where the test fixture is injected with a known level of power of different frequencies at the test points and measurements are taken on the adjacent pins. These procedures mimic the effects of the parasitic components on the RF signal performance within the fixture when it is installed on the automatic test equipment.es_ES
dc.language.isoenes_ES
dc.publisherSTIes_ES
dc.rightsAtribución-NoComercial-CompartirIgual 2.5 México*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/2.5/mx/*
dc.subjectDragon test systemes_ES
dc.titleAn improvement proposal for mismatch condition problem in dragon test systemes_ES
dc.typeThesises_ES
dc.description.degreeMaestriaes_ES
dc.subject.sedeCampus Mexicalies_ES
Aparece en las colecciones: Tesis y Monografías

Ficheros en este ítem:
Fichero Descripción Tamaño Formato  
EnricoMarcelo_ProyectoAplicacion.pdfAn improvement proposal for mismatch condition problem in dragon test system2.63 MBAdobe PDFVista previa
Visualizar/Abrir


Este ítem está protegido por copyright original



Este ítem está sujeto a una licencia Creative Commons Licencia Creative Commons Creative Commons